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I DDO = ( I DDO ( D ) + (0.5 × 10 ) × C L V DDO ) × (2 f ? f r ) + I DDO ( Q )
ADuM3220/ADuM3221
POWER CONSUMPTION
The supply current at a given channel of the ADuM3220 /
ADuM3221 isolator is a function of the supply voltage, channel
data rate, and channel output load.
For each input channel, the supply current is given by
I DDI = I DDI ( Q ) f ≤ 0.5 f r
I DDI = I DDI ( D ) × (2 f ? f r ) + I DDI(Q) f > 0.5 f r
For each output channel, the supply current is given by
I DDO = I DDO ( Q ) f ≤ 0.5 f r
?3
f > 0.5 f r
where:
I DDI(D) , I DDO(D) are the input and output dynamic supply currents
per channel (mA/Mbps).
C L is the output load capacitance (pF).
V DDO is the output supply voltage (V).
f is the input logic signal frequency (MHz, half of the input data
rate, NRZ signaling).
f r is the input stage refresh rate (Mbps).
I DDI(Q) , I DDO(Q) are the specified input and output quiescent supply
currents (mA).
To calculate the total I DD1 and I DD2 supply current, the supply
currents for each input and output channel corresponding to
I DD1 and I DD2 are calculated and totaled.
Figure 9 provides total input I DD1 supply current as a function of
frequency for both input channels. Figure 10 provides total I DD2
supply current as a function of frequency for both outputs loaded
with 2 nF capacitance.
INSULATION LIFETIME
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of insu-
lation degradation is dependent on the characteristics of the voltage
waveform applied across the insulation. In addition to the testing
performed by the regulatory agencies, Analog Devices carries out
an extensive set of evaluations to determine the lifetime of the
insulation structure within the ADuM3220 / ADuM3221 .
Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage. Accel-
eration factors for several operating conditions are determined.
Data Sheet
The values shown in Table 9 summarize the peak voltage for
50 years of service life. In many cases, the approved working
voltage is higher than the 50-year service life voltage. Operation
at these high working voltages can lead to shortened insulation
life in some cases.
The insulation lifetime of the ADuM3220 / ADuM3221 depends
on the voltage waveform type imposed across the isolation
barrier. The i Coupler insulation structure degrades at different
rates depending on whether the waveform is bipolar ac, unipo-
lar ac, or dc. Figure 24, Figure 25, and Figure 26 illustrate these
different isolation voltage waveforms.
A bipolar ac voltage environment is the worst case for the
i Coupler products and is the 50-year operating lifetime that
Analog Devices recommends for maximum working voltage. In
the case of unipolar ac or dc voltage, the stress on the insulation
is significantly lower. This allows operation at higher working
voltages while still achieving a 50-year service life. Any cross-
insulation voltage waveform that does not conform to Figure 25
or Figure 26 should be treated as a bipolar ac waveform, and its
peak voltage should be limited to the 50-year lifetime voltage
value listed in Table 9.
Note that the voltage presented in Figure 25 is shown as sinu-
soidal for illustration purposes only. It is meant to represent any
voltage waveform varying between 0 V and some limiting value.
The limiting value can be positive or negative, but the voltage
cannot cross 0 V.
RATED PEAK VOLTAGE
0V
Figure 24. Bipolar AC Waveform
RATED PEAK VOLTAGE
0V
Figure 25. Unipolar AC Waveform
RATED PEAK VOLTAGE
0V
Figure 26. DC Waveform
These factors allow calculation of the time to failure at the actual
working voltage.
Rev. C | Page 14 of 16
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